SENTECH would like to invite you to this year’s Thin Film Metrology Seminar and Workshop on 29-30 November 2023, to be held at the SENTECH Berlin-Adlershof Campus.

The seminar’s main purpose is to examine the latest advances in ellipsometry and other key technologies and share leading-edge, application-based research results with the thin-layer research community. There will be plenty of networking opportunities for discussion and ideas in this evolving area of scientific analysis and ellipsometry measurements.

Invited expert speakers from both research & development and industry will be in attendance to give presentations on topics including optical coatings, mid infrared applications optical, 2D materials, and quality control on SiC and in device packaging.

In addition to the seminar on day one, day two will feature a workshop covering an introduction to ellipsometry through to more advanced use cases. Experts from the SENTECH Metrology Application Team will be on-hand to work with delegates’ individual, non-confidential applications.

SENTECH will be hosting a roundtable dinner, which is open to all delegates joining the event and will take place on 29 November 2023 at 7 PM. Delegates, expert speakers, and members of the SENTECH team will have the opportunity to network in an informal atmosphere while enjoying a great meal.

The SENTECH Thin Film Metrology Seminar and Workshop will take place at SENTECH Instruments, Schwarzschildstraße 2, Berlin-Adlershof, on 29-30 November 2023. The seminar cost is 300 EUR and the workshop price is 200 EUR including taxes per delegate. Spaces are limited so will be allocated on a first-come-first-served basis.

Please see the agenda here:  PROGRAMM - SENTECH Messtechnik 2023 Seminar und Workshop 

Please register here:  Anmeldung - Registration SENTECH Messtechnik Seminar+Workshop 2023 

Please send your registration form to sales@sentech.de

*Please note that the seminar and workshop presentations and training sessions will be in English